Method for calibration and removal of wavefront errors, R. Smythe, D. Battistoni; US Patent No. 7,405,833

Calibration standard for optical gap measuring tools, de Groot; Peter, Biegen; James, Deck; Leslie, Smythe; Robert, US Patent No. 5,724,134

Compact, Linear Measurement Interferometer with Zero Abbe Error, R. Smythe, G. Richarson, J. Bunkenburg; US Patent No. 4,509,858, 1985.

The measure of metrology, Proceedings of the ASPE Annual Meeting, October 2009

Asphere interferometry powers precision lens manufacturing, Laser Focus World, October 2006

Laser diodes map surface flatness of complex parts, P. de Groot, R. Smythe, and L. Deck, Laser Focus World, February 94

Pole Tip Recession Measurement of Thin Film Sliders, R. Smythe, L. Selberg, Dr. L. Deck; International Disk Conference, Tokyo, Japan, April 92 and Diskcon, San Jose, CA, September 92.

QFD, Designing a World Class Product, R. Smythe, OSA Optcon, Boston, MA; Nov. 90

Sub-Angstrom, Vertical Resolution, Three Dimensional Phase Measuring Microscope, F. Demarest, R. Smythe, ASPE 90, Rochester NY

Technical overview of Maxim3D, R. Smythe First Surface Roughness Conference, Tokyo Japan

Simple Fast and Adaptable, New-Generation Interferometers, R. Smythe, Photonics Spectra, August 90

High Resolution Phase Measuring Laser Interferometric Microscope for Engineering Surface Metrology, J. Biegen, R. Smythe, SPIE Vol. 1009 , Hamburg FRG September, 1988.

High Resolution Phase Measuring Laser Interferometric Microscope for Engineering Surface Metrology, J. Biegen, R. Smythe, SPIE Vol. 897, January, 1988.

Heterodyne Profiling Interferometer, R. Smythe, ASPE Dallas TX 1988

Recent Advances in Interferometry at Zygo, B. Truax, J. Soobitsky, R. Smythe, SPIE Conference, August 87.

Hetrodyne Profiler moves from R&D to the Marketplace, R. Smythe, Laser Focus, July 87

Instantaneous Phase Measuring Interferometry, R. Smythe, R. Moore, SPIE Vol. 429, 1983 (49 Citations)

A NeHe Gas Purification System for Large Flash Chambers, R.A. Smythe et. al., Nuclear Instruments and Methods 193 (1982) 457- 461